K. Fujita, S. Oomi, K. Toyozawa, S. Minamide, T. Maeda
{"title":"超薄表面贴装IC封装(0.8 mm厚TQFP)的研制","authors":"K. Fujita, S. Oomi, K. Toyozawa, S. Minamide, T. Maeda","doi":"10.1109/ECTC.1990.122206","DOIUrl":null,"url":null,"abstract":"A TQFP (thin quad flat package) with a package size of 10*10 mm and a maximum package thickness of 0.8 mm has been developed to meet the need for lower profiles in surface-mounting packages. For a package thickness of 1.0 mm, the conventional lead-frame thickness and chip thickness are sufficient. However, when the package thickness is reduced to 0.8 mm, a reduction in at least one of the conventional thicknesses is absolutely essential. Therefore, by reducing the thickness of only part of the die-pad portion of the lead frame through the use of chemical etching to approximately 1/2 to 2/3, the resin thickness above the chip and below the die pad is ensured. A low-loop wire bond with a maximum of 0.14 mm was achieved by optimizing the wire material and wire-bond conditions. Ultrathin molding was achieved by improving the fluid characteristics of the resin and by ensuring the resin-fluid balance within the cavity. Package cracking and degraded moisture resistance were evaluated using a 4-Mbit mask ROM. After subjecting it to 85 degrees C and 75% RH for 72 h, no problems were noticed while soldering at 240 degrees C maximum with infrared reflow.<<ETX>>","PeriodicalId":102875,"journal":{"name":"40th Conference Proceedings on Electronic Components and Technology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Development of ultra-thin surface mounting IC package (0.8 mm thick TQFP)\",\"authors\":\"K. Fujita, S. Oomi, K. Toyozawa, S. Minamide, T. Maeda\",\"doi\":\"10.1109/ECTC.1990.122206\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A TQFP (thin quad flat package) with a package size of 10*10 mm and a maximum package thickness of 0.8 mm has been developed to meet the need for lower profiles in surface-mounting packages. For a package thickness of 1.0 mm, the conventional lead-frame thickness and chip thickness are sufficient. However, when the package thickness is reduced to 0.8 mm, a reduction in at least one of the conventional thicknesses is absolutely essential. Therefore, by reducing the thickness of only part of the die-pad portion of the lead frame through the use of chemical etching to approximately 1/2 to 2/3, the resin thickness above the chip and below the die pad is ensured. A low-loop wire bond with a maximum of 0.14 mm was achieved by optimizing the wire material and wire-bond conditions. Ultrathin molding was achieved by improving the fluid characteristics of the resin and by ensuring the resin-fluid balance within the cavity. Package cracking and degraded moisture resistance were evaluated using a 4-Mbit mask ROM. After subjecting it to 85 degrees C and 75% RH for 72 h, no problems were noticed while soldering at 240 degrees C maximum with infrared reflow.<<ETX>>\",\"PeriodicalId\":102875,\"journal\":{\"name\":\"40th Conference Proceedings on Electronic Components and Technology\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-05-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"40th Conference Proceedings on Electronic Components and Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.1990.122206\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"40th Conference Proceedings on Electronic Components and Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1990.122206","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Development of ultra-thin surface mounting IC package (0.8 mm thick TQFP)
A TQFP (thin quad flat package) with a package size of 10*10 mm and a maximum package thickness of 0.8 mm has been developed to meet the need for lower profiles in surface-mounting packages. For a package thickness of 1.0 mm, the conventional lead-frame thickness and chip thickness are sufficient. However, when the package thickness is reduced to 0.8 mm, a reduction in at least one of the conventional thicknesses is absolutely essential. Therefore, by reducing the thickness of only part of the die-pad portion of the lead frame through the use of chemical etching to approximately 1/2 to 2/3, the resin thickness above the chip and below the die pad is ensured. A low-loop wire bond with a maximum of 0.14 mm was achieved by optimizing the wire material and wire-bond conditions. Ultrathin molding was achieved by improving the fluid characteristics of the resin and by ensuring the resin-fluid balance within the cavity. Package cracking and degraded moisture resistance were evaluated using a 4-Mbit mask ROM. After subjecting it to 85 degrees C and 75% RH for 72 h, no problems were noticed while soldering at 240 degrees C maximum with infrared reflow.<>