超薄表面贴装IC封装(0.8 mm厚TQFP)的研制

K. Fujita, S. Oomi, K. Toyozawa, S. Minamide, T. Maeda
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引用次数: 5

摘要

一种封装尺寸为10* 10mm,最大封装厚度为0.8 mm的TQFP(薄四平面封装)已经开发出来,以满足表面贴装封装中对低轮廓的需求。对于厚度为1.0 mm的封装,传统的引线框架厚度和芯片厚度就足够了。然而,当封装厚度减少到0.8毫米时,至少减少一种传统厚度是绝对必要的。因此,通过使用化学蚀刻将引线框架的部分模垫部分的厚度减少到大约1/2到2/3,确保了芯片上方和模垫下方的树脂厚度。通过优化焊丝材料和焊丝结合条件,实现了最大0.14 mm的低环焊丝结合。通过改善树脂的流体特性和确保腔内树脂-流体平衡,实现了超薄成型。使用4 mbit掩模ROM评估封装开裂和防潮性能下降。将其置于85℃和75% RH下72小时后,使用红外回流焊在最高240℃下焊接时没有发现任何问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Development of ultra-thin surface mounting IC package (0.8 mm thick TQFP)
A TQFP (thin quad flat package) with a package size of 10*10 mm and a maximum package thickness of 0.8 mm has been developed to meet the need for lower profiles in surface-mounting packages. For a package thickness of 1.0 mm, the conventional lead-frame thickness and chip thickness are sufficient. However, when the package thickness is reduced to 0.8 mm, a reduction in at least one of the conventional thicknesses is absolutely essential. Therefore, by reducing the thickness of only part of the die-pad portion of the lead frame through the use of chemical etching to approximately 1/2 to 2/3, the resin thickness above the chip and below the die pad is ensured. A low-loop wire bond with a maximum of 0.14 mm was achieved by optimizing the wire material and wire-bond conditions. Ultrathin molding was achieved by improving the fluid characteristics of the resin and by ensuring the resin-fluid balance within the cavity. Package cracking and degraded moisture resistance were evaluated using a 4-Mbit mask ROM. After subjecting it to 85 degrees C and 75% RH for 72 h, no problems were noticed while soldering at 240 degrees C maximum with infrared reflow.<>
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CiteScore
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