高压直流供电系统中半导体断路器的故障机理

S. Abe, K. Fukushima, Sihun Yang, M. Ogawa, Kosuke Nomura, M. Shoyama, T. Ninomiya, A. Matsumoto, A. Fukui, M. Yamasaki
{"title":"高压直流供电系统中半导体断路器的故障机理","authors":"S. Abe, K. Fukushima, Sihun Yang, M. Ogawa, Kosuke Nomura, M. Shoyama, T. Ninomiya, A. Matsumoto, A. Fukui, M. Yamasaki","doi":"10.1109/ECCE.2010.5617785","DOIUrl":null,"url":null,"abstract":"This paper considers the malfunction mechanism of semiconductor circuit breaker in high voltage DC power supply system (HVDC). In HVDC system, the fast response breaker is required. Semiconductor circuit breaker is paid attention as one of the key technology in HVDC. However, in some condition, the semiconductor circuit is malfunctioned. When malfunction is happened, unexpected large current is flown to the other normal line. In this paper, the malfunction mechanism of semiconductor circuit breaker is considered. It demonstrated by using MATLAB/Simulink. Moreover, the demonstrated results are confirmed by experimentally.","PeriodicalId":161915,"journal":{"name":"2010 IEEE Energy Conversion Congress and Exposition","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Malfunction mechanism of semiconductor circuit breaker in HVDC power supply system\",\"authors\":\"S. Abe, K. Fukushima, Sihun Yang, M. Ogawa, Kosuke Nomura, M. Shoyama, T. Ninomiya, A. Matsumoto, A. Fukui, M. Yamasaki\",\"doi\":\"10.1109/ECCE.2010.5617785\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper considers the malfunction mechanism of semiconductor circuit breaker in high voltage DC power supply system (HVDC). In HVDC system, the fast response breaker is required. Semiconductor circuit breaker is paid attention as one of the key technology in HVDC. However, in some condition, the semiconductor circuit is malfunctioned. When malfunction is happened, unexpected large current is flown to the other normal line. In this paper, the malfunction mechanism of semiconductor circuit breaker is considered. It demonstrated by using MATLAB/Simulink. Moreover, the demonstrated results are confirmed by experimentally.\",\"PeriodicalId\":161915,\"journal\":{\"name\":\"2010 IEEE Energy Conversion Congress and Exposition\",\"volume\":\"48 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE Energy Conversion Congress and Exposition\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECCE.2010.5617785\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE Energy Conversion Congress and Exposition","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECCE.2010.5617785","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文研究了高压直流供电系统中半导体断路器的故障机理。在高压直流系统中,需要快速响应的断路器。半导体断路器作为高压直流输电的关键技术之一,受到了广泛的关注。然而,在某些情况下,半导体电路出现故障。当发生故障时,意外的大电流会流向另一条法线。本文研究了半导体断路器的故障机理。使用MATLAB/Simulink进行了演示。并通过实验验证了所证明的结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Malfunction mechanism of semiconductor circuit breaker in HVDC power supply system
This paper considers the malfunction mechanism of semiconductor circuit breaker in high voltage DC power supply system (HVDC). In HVDC system, the fast response breaker is required. Semiconductor circuit breaker is paid attention as one of the key technology in HVDC. However, in some condition, the semiconductor circuit is malfunctioned. When malfunction is happened, unexpected large current is flown to the other normal line. In this paper, the malfunction mechanism of semiconductor circuit breaker is considered. It demonstrated by using MATLAB/Simulink. Moreover, the demonstrated results are confirmed by experimentally.
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