F. Malatesta, M. Ottavi, G. Cardarilli, G. Furano, A. Menicucci, C. Cazzaniga, C. Andreani, R. Senesi, C. Scatigno
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In this paper we report the measurement of the soft-error sensitivity of an ARM Cortex M0 core conducted at the ISIS ChipIR neutron irradiation facility. The test setup also included a CMOS camera sensor used for dosimetry estimation. The results provide the core memory and internal resources cross section thus giving useful information for developing ad-hoc fault tolerant techniques on sensitive parts.
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