{"title":"可测试性等于可生产性","authors":"M. V. Marth","doi":"10.1109/IMTC.1990.66044","DOIUrl":null,"url":null,"abstract":"The key elements of designing for testability are presented. The following issues are discussed: review of requirements, partitioning, identification of critical parameters, tolerance threshold, selection, test flow development, assessment of testability parameters, and design update and reiteration. The benefits of designing for testability are discussed.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Testability equals producibility\",\"authors\":\"M. V. Marth\",\"doi\":\"10.1109/IMTC.1990.66044\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The key elements of designing for testability are presented. The following issues are discussed: review of requirements, partitioning, identification of critical parameters, tolerance threshold, selection, test flow development, assessment of testability parameters, and design update and reiteration. The benefits of designing for testability are discussed.<<ETX>>\",\"PeriodicalId\":404761,\"journal\":{\"name\":\"7th IEEE Conference on Instrumentation and Measurement Technology\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-02-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"7th IEEE Conference on Instrumentation and Measurement Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.1990.66044\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"7th IEEE Conference on Instrumentation and Measurement Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1990.66044","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The key elements of designing for testability are presented. The following issues are discussed: review of requirements, partitioning, identification of critical parameters, tolerance threshold, selection, test flow development, assessment of testability parameters, and design update and reiteration. The benefits of designing for testability are discussed.<>
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