{"title":"基于C45SOI的USB验证挑战C28NM技术产品","authors":"M. Pandey, Atul Gupta, Shwetank Shekhar","doi":"10.1109/MTV.2013.12","DOIUrl":null,"url":null,"abstract":"With shrinking technologies, high speed design such as USB starts giving all sort of problem. The issues which come due to aforesaid reason are difficult to debug, analyze and root-cause. The traditional USB Validation approach is unable to discover all the issues leading to customer reject. With inclusion of aggressive new test cases in Validation plan under the umbrella of \"Firmware based Validation\" numerous issues were caught in USB design. The complex issues of USB caught and elegant solution to those problems are described in this paper as case studies.","PeriodicalId":129513,"journal":{"name":"2013 14th International Workshop on Microprocessor Test and Verification","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"USB Validation Challenges on C45SOI & C28NM Technology Products\",\"authors\":\"M. Pandey, Atul Gupta, Shwetank Shekhar\",\"doi\":\"10.1109/MTV.2013.12\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"With shrinking technologies, high speed design such as USB starts giving all sort of problem. The issues which come due to aforesaid reason are difficult to debug, analyze and root-cause. The traditional USB Validation approach is unable to discover all the issues leading to customer reject. With inclusion of aggressive new test cases in Validation plan under the umbrella of \\\"Firmware based Validation\\\" numerous issues were caught in USB design. The complex issues of USB caught and elegant solution to those problems are described in this paper as case studies.\",\"PeriodicalId\":129513,\"journal\":{\"name\":\"2013 14th International Workshop on Microprocessor Test and Verification\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-12-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 14th International Workshop on Microprocessor Test and Verification\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MTV.2013.12\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 14th International Workshop on Microprocessor Test and Verification","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MTV.2013.12","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
USB Validation Challenges on C45SOI & C28NM Technology Products
With shrinking technologies, high speed design such as USB starts giving all sort of problem. The issues which come due to aforesaid reason are difficult to debug, analyze and root-cause. The traditional USB Validation approach is unable to discover all the issues leading to customer reject. With inclusion of aggressive new test cases in Validation plan under the umbrella of "Firmware based Validation" numerous issues were caught in USB design. The complex issues of USB caught and elegant solution to those problems are described in this paper as case studies.
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