基于聚类和填充算法的PCB接地缺陷检测

R. Melnyk, Yurii Havrylko, Mariia Levytska
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引用次数: 0

摘要

实现了已知的K-means聚类和洪水填充算法。为了减少颜色数,实现了聚类算法的多级分割。许多级别是从用户中获取的。标准龙PCB图像可以用来确定像素形成接触的坐标。采用填充算法对触点、迹线和地平面进行标记。该算法还用于控制链的接触。利用标记链的模型来检测印制电路板上的弹孔和开口缺陷。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Defects Detection in PCB with Ground Plane by Clustering and Flood-fill Algorithms
The known K-means clustering and flood-fill algorithms are implemented. To reduce the color number multilevel segmentation by clustering algorithm is realized. A number of levels are taken from user. The etalon PCB image can be used to determine coordinate of pixels forming contacts. The flood-fill algorithm is used to mark contacts, traces and ground plane. The flood-fill algorithm also is used to control contacts of chains. The model of marked chains is being used to detect defects of shot and open in the manufactured PCB.
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