{"title":"特斯拉:使用微流体热稳定3D堆叠STT-RAM缓存","authors":"Majed Valad Beigi, G. Memik","doi":"10.1109/ICCD.2016.7753299","DOIUrl":null,"url":null,"abstract":"In this work, we develop a 3D architecture that utilizes STT-RAM for the last level cache (LLC). 3D integration enables large LLCs to be stacked onto a die. However, 3D architectures suffer from higher operating temperatures due to increased power densities. The elevated temperatures can adversely impact the STT-RAM performance and reliability. The objective of this paper is to address the limits of integrating STT-RAM in 3D chip stacks from a thermal perspective and propose a novel stacking structure that minimizes heat-induced problems. Specifically, we analyze the system-level impact of increased temperatures and propose a novel technique to dynamically adjust the flow rate of the liquid interlayer cooling at run time to reduce the STT-RAM temperature and alleviate temperature-induced problems that cause the performance degradation and prevent overcooling the STT-RAM die and minimize the pump energy consumption. Evaluation results reveal that our approach achieves up to 19.1% performance improvement and 14.6% power reduction over an architecture that does not include an insulating layer.","PeriodicalId":297899,"journal":{"name":"2016 IEEE 34th International Conference on Computer Design (ICCD)","volume":"104 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":"{\"title\":\"TESLA: Using microfluidics to thermally stabilize 3D stacked STT-RAM caches\",\"authors\":\"Majed Valad Beigi, G. Memik\",\"doi\":\"10.1109/ICCD.2016.7753299\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, we develop a 3D architecture that utilizes STT-RAM for the last level cache (LLC). 3D integration enables large LLCs to be stacked onto a die. However, 3D architectures suffer from higher operating temperatures due to increased power densities. The elevated temperatures can adversely impact the STT-RAM performance and reliability. The objective of this paper is to address the limits of integrating STT-RAM in 3D chip stacks from a thermal perspective and propose a novel stacking structure that minimizes heat-induced problems. Specifically, we analyze the system-level impact of increased temperatures and propose a novel technique to dynamically adjust the flow rate of the liquid interlayer cooling at run time to reduce the STT-RAM temperature and alleviate temperature-induced problems that cause the performance degradation and prevent overcooling the STT-RAM die and minimize the pump energy consumption. Evaluation results reveal that our approach achieves up to 19.1% performance improvement and 14.6% power reduction over an architecture that does not include an insulating layer.\",\"PeriodicalId\":297899,\"journal\":{\"name\":\"2016 IEEE 34th International Conference on Computer Design (ICCD)\",\"volume\":\"104 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"17\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 34th International Conference on Computer Design (ICCD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCD.2016.7753299\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 34th International Conference on Computer Design (ICCD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCD.2016.7753299","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
TESLA: Using microfluidics to thermally stabilize 3D stacked STT-RAM caches
In this work, we develop a 3D architecture that utilizes STT-RAM for the last level cache (LLC). 3D integration enables large LLCs to be stacked onto a die. However, 3D architectures suffer from higher operating temperatures due to increased power densities. The elevated temperatures can adversely impact the STT-RAM performance and reliability. The objective of this paper is to address the limits of integrating STT-RAM in 3D chip stacks from a thermal perspective and propose a novel stacking structure that minimizes heat-induced problems. Specifically, we analyze the system-level impact of increased temperatures and propose a novel technique to dynamically adjust the flow rate of the liquid interlayer cooling at run time to reduce the STT-RAM temperature and alleviate temperature-induced problems that cause the performance degradation and prevent overcooling the STT-RAM die and minimize the pump energy consumption. Evaluation results reveal that our approach achieves up to 19.1% performance improvement and 14.6% power reduction over an architecture that does not include an insulating layer.