伪装缺陷识别:一种新方法

Nagappa U. Bhajantri, P. Nagabhushan
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引用次数: 51

摘要

伪装是一种利用共现矩阵纹理特性掩盖目标的特征,使目标在其背景框架中得到升华的方法。本研究工作的目的是检测这种伪装缺陷。由于背景与缺陷的纹理相似性是伪装成功的前提,因此需要通过深入的纹理分析将缺陷与背景区分开来。在提出的工作中,我们打算采用基于共现矩阵的纹理特征在块内计算,图像的一个小区域。最后通过聚类分析检测出缺陷部分,并通过!分水岭分割。几个实验证明了所提出的模型在发现伪装缺陷方面的适用性。在合成图像和真实图像上的实验证实了该方法的潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Camouflage Defect Identification: A Novel Approach
Camouflaging is an attempt to obscure the signature of a target and sublimate the target in its background frame in terms of co-occurrence matrix texture properties. The objective of this research work is to detect such camouflaged defect. Since the texture similarity between the background and the defect is the premise for accomplishing camouflage, an intensive texture analysis should be able to discriminate defect from its background. In the proposed work we intended to employ Co-occurrence matrix based texture features are computed within the block, a small region of the image. Finally defective portions are detected by cluster analysis and identified through!. Watershed segmentation. Several experiments have been conducted to demonstrate the suitability of the proposed model to spot camouflaged defects. Experimentation on the synthetic and real images corroborates the potential of the method.
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