W. Snoeys, G. Aglieri Rinella, A. Andronic, M. Antonelli, R. Baccomi, R. Ballabriga Sune, M. Barbero, P. Barrillon, J. Baudot, P. Becht, F. Benotto, S. Beole, G. Bertolone, A. Besson, W. Białas, G. Borghello, J. Braach, M. Buckland, S. Bugiel, E. Buschmann, P. Camerini, M. Campbell, F. Carnesecchi, L. Cecconi, E. Charbon, Ankur Chauhan, C. Colledani, G. Contin, D. Dannheim, K. Dort, João Pacheco de Melo, W. Deng, G. de Robertis, A. Di Mauro, A. Dorda Martin, A. Dorokhov, P. Dorosz, G. Eberwein, Z. El Bitar, X. Fang, A. Fenigstein, C. Ferrero, D. Fougeron, D. Gajanana, M. Goffe, L. Gonella, A. Grelli, V. Gromov, Alexandre Habib, Adi Haim, K. Hansen, J. Hasenbichler, H. Hillemanns, G. Hong, Ch. Hu, A. Isakov, K. Jaaskelainen, A. Junique, A. Kotliarov, I. Kremastiotis, F. Krizek, A. Kluge, R. Kluit, G. Kucharska, T. Kugathasan, Y. Kwon, P. La Rocca, L. Lautner, Pedro V. Leitão, B. Lim, F. Loddo, M. Mager, D. Marras, P. Martinengo, S. Masciocchi, Soniya Mathew, M. Menzel, F. Morel, B. Mulyanto, M. Münker, L.
{"title":"高能物理中单片传感器65纳米CMOS成像技术的优化","authors":"W. Snoeys, G. Aglieri Rinella, A. Andronic, M. Antonelli, R. Baccomi, R. Ballabriga Sune, M. Barbero, P. Barrillon, J. Baudot, P. Becht, F. Benotto, S. Beole, G. Bertolone, A. Besson, W. Białas, G. Borghello, J. Braach, M. Buckland, S. Bugiel, E. Buschmann, P. Camerini, M. Campbell, F. Carnesecchi, L. Cecconi, E. Charbon, Ankur Chauhan, C. Colledani, G. Contin, D. Dannheim, K. Dort, João Pacheco de Melo, W. Deng, G. de Robertis, A. Di Mauro, A. Dorda Martin, A. Dorokhov, P. Dorosz, G. Eberwein, Z. El Bitar, X. Fang, A. Fenigstein, C. Ferrero, D. Fougeron, D. Gajanana, M. Goffe, L. Gonella, A. Grelli, V. Gromov, Alexandre Habib, Adi Haim, K. Hansen, J. Hasenbichler, H. Hillemanns, G. Hong, Ch. Hu, A. Isakov, K. Jaaskelainen, A. Junique, A. Kotliarov, I. Kremastiotis, F. Krizek, A. Kluge, R. Kluit, G. Kucharska, T. Kugathasan, Y. Kwon, P. La Rocca, L. Lautner, Pedro V. Leitão, B. Lim, F. Loddo, M. Mager, D. Marras, P. Martinengo, S. Masciocchi, Soniya Mathew, M. Menzel, F. Morel, B. Mulyanto, M. Münker, L. ","doi":"10.22323/1.420.0083","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":275608,"journal":{"name":"Proceedings of 10th International Workshop on Semiconductor Pixel Detectors for Particles and Imaging — PoS(Pixel2022)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Optimization of a 65 nm CMOS Imaging Technology for Monolithic Sensors in High Energy Physics\",\"authors\":\"W. Snoeys, G. Aglieri Rinella, A. Andronic, M. Antonelli, R. Baccomi, R. Ballabriga Sune, M. Barbero, P. Barrillon, J. Baudot, P. Becht, F. Benotto, S. Beole, G. Bertolone, A. Besson, W. Białas, G. Borghello, J. Braach, M. Buckland, S. Bugiel, E. Buschmann, P. Camerini, M. Campbell, F. Carnesecchi, L. Cecconi, E. Charbon, Ankur Chauhan, C. Colledani, G. Contin, D. Dannheim, K. Dort, João Pacheco de Melo, W. Deng, G. de Robertis, A. Di Mauro, A. Dorda Martin, A. Dorokhov, P. Dorosz, G. Eberwein, Z. El Bitar, X. Fang, A. Fenigstein, C. Ferrero, D. Fougeron, D. Gajanana, M. Goffe, L. Gonella, A. Grelli, V. Gromov, Alexandre Habib, Adi Haim, K. Hansen, J. Hasenbichler, H. Hillemanns, G. Hong, Ch. Hu, A. Isakov, K. Jaaskelainen, A. Junique, A. Kotliarov, I. Kremastiotis, F. Krizek, A. Kluge, R. Kluit, G. Kucharska, T. Kugathasan, Y. Kwon, P. La Rocca, L. Lautner, Pedro V. Leitão, B. Lim, F. Loddo, M. Mager, D. Marras, P. Martinengo, S. Masciocchi, Soniya Mathew, M. Menzel, F. Morel, B. Mulyanto, M. Münker, L. \",\"doi\":\"10.22323/1.420.0083\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":275608,\"journal\":{\"name\":\"Proceedings of 10th International Workshop on Semiconductor Pixel Detectors for Particles and Imaging — PoS(Pixel2022)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-03-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 10th International Workshop on Semiconductor Pixel Detectors for Particles and Imaging — PoS(Pixel2022)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.22323/1.420.0083\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 10th International Workshop on Semiconductor Pixel Detectors for Particles and Imaging — PoS(Pixel2022)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.22323/1.420.0083","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}