多车道SerDes供电网络挑战与Decap优化

Akhila Purushothaman, Siddharth Rajagopalan, M. Moorthy
{"title":"多车道SerDes供电网络挑战与Decap优化","authors":"Akhila Purushothaman, Siddharth Rajagopalan, M. Moorthy","doi":"10.1109/EDAPS56906.2022.9995015","DOIUrl":null,"url":null,"abstract":"As we move into the complex design of high-speed IOs working at increased datarates of more than 100G, power delivery network (PDN) optimization becomes more challenging. To meet the stringent Power Delivery Network noise specifications, we make sure that the impedance seen by the device meets the target impedance, by optimizing the decap (decoupling capacitor) requirements at PCB, package, and die. Package level decap optimization is one of the major challenges to be addressed to meet the voltage ripple requirements with minimal BOM(Bill of Materials) cost. Here we propose a method to perform the decap optimization of the Serdes with a shared power delivery network, considering the impact of power supply noise coupling in multi-lane shared SerDes. This paper analyses the impact on ripple voltage from different voltage noise sources and explains how the PDN design accuracy can be improved in the frequency domain without having to run the transient simulation every time, which is a time-consuming process and poses challenges to Time-to-Market (TTM) concerns.","PeriodicalId":401014,"journal":{"name":"2022 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Multi-lane SerDes Power Delivery Network Challenges and Decap Optimization\",\"authors\":\"Akhila Purushothaman, Siddharth Rajagopalan, M. Moorthy\",\"doi\":\"10.1109/EDAPS56906.2022.9995015\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As we move into the complex design of high-speed IOs working at increased datarates of more than 100G, power delivery network (PDN) optimization becomes more challenging. To meet the stringent Power Delivery Network noise specifications, we make sure that the impedance seen by the device meets the target impedance, by optimizing the decap (decoupling capacitor) requirements at PCB, package, and die. Package level decap optimization is one of the major challenges to be addressed to meet the voltage ripple requirements with minimal BOM(Bill of Materials) cost. Here we propose a method to perform the decap optimization of the Serdes with a shared power delivery network, considering the impact of power supply noise coupling in multi-lane shared SerDes. This paper analyses the impact on ripple voltage from different voltage noise sources and explains how the PDN design accuracy can be improved in the frequency domain without having to run the transient simulation every time, which is a time-consuming process and poses challenges to Time-to-Market (TTM) concerns.\",\"PeriodicalId\":401014,\"journal\":{\"name\":\"2022 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-12-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDAPS56906.2022.9995015\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDAPS56906.2022.9995015","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

随着我们进入高速IOs的复杂设计,在超过100G的数据下工作,电力传输网络(PDN)的优化变得更具挑战性。为了满足严格的电力输送网络噪声规范,我们通过优化PCB、封装和芯片上的decap(去耦电容)要求,确保器件看到的阻抗符合目标阻抗。为了以最小的物料清单成本满足电压纹波要求,封装级封装优化是需要解决的主要挑战之一。在此,我们提出了一种基于共享输电网络的多车道共享输电网络中,考虑到电源噪声耦合的影响,对多车道共享输电网络进行decap优化的方法。本文分析了不同电压噪声源对纹波电压的影响,并解释了如何在频域提高PDN设计精度,而不必每次都进行瞬态仿真,这是一个耗时的过程,并对上市时间(TTM)提出了挑战。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Multi-lane SerDes Power Delivery Network Challenges and Decap Optimization
As we move into the complex design of high-speed IOs working at increased datarates of more than 100G, power delivery network (PDN) optimization becomes more challenging. To meet the stringent Power Delivery Network noise specifications, we make sure that the impedance seen by the device meets the target impedance, by optimizing the decap (decoupling capacitor) requirements at PCB, package, and die. Package level decap optimization is one of the major challenges to be addressed to meet the voltage ripple requirements with minimal BOM(Bill of Materials) cost. Here we propose a method to perform the decap optimization of the Serdes with a shared power delivery network, considering the impact of power supply noise coupling in multi-lane shared SerDes. This paper analyses the impact on ripple voltage from different voltage noise sources and explains how the PDN design accuracy can be improved in the frequency domain without having to run the transient simulation every time, which is a time-consuming process and poses challenges to Time-to-Market (TTM) concerns.
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