{"title":"新型瞬态检测电路用于显示面板的快速瞬态保护设计","authors":"M. Ker, Wan-Yen Lin, Cheng-Cheng Yen, Che-Ming Yang, Tung-Yang Chen, Shih-Fan Chen","doi":"10.1109/ICICDT.2010.5510297","DOIUrl":null,"url":null,"abstract":"A new transient detection circuit against electrical fast transient (EFT) disturbance is proposed for display panel protection. The circuit function to detect positive or negative electrical transients under EFT tests has been investigated in HSPICE simulation and verified in silicon chip. The output of the proposed transient detection circuit can be used as a firmware index to execute system automatic recovery operation. With hardware/firmware co-design, the immunity of display panel against transient disturbance under EFT tests can be significantly improved.","PeriodicalId":187361,"journal":{"name":"2010 IEEE International Conference on Integrated Circuit Design and Technology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"New transient detection circuit for electrical fast transient (EFT) protection design in display panels\",\"authors\":\"M. Ker, Wan-Yen Lin, Cheng-Cheng Yen, Che-Ming Yang, Tung-Yang Chen, Shih-Fan Chen\",\"doi\":\"10.1109/ICICDT.2010.5510297\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new transient detection circuit against electrical fast transient (EFT) disturbance is proposed for display panel protection. The circuit function to detect positive or negative electrical transients under EFT tests has been investigated in HSPICE simulation and verified in silicon chip. The output of the proposed transient detection circuit can be used as a firmware index to execute system automatic recovery operation. With hardware/firmware co-design, the immunity of display panel against transient disturbance under EFT tests can be significantly improved.\",\"PeriodicalId\":187361,\"journal\":{\"name\":\"2010 IEEE International Conference on Integrated Circuit Design and Technology\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-06-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE International Conference on Integrated Circuit Design and Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICICDT.2010.5510297\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Conference on Integrated Circuit Design and Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICICDT.2010.5510297","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
New transient detection circuit for electrical fast transient (EFT) protection design in display panels
A new transient detection circuit against electrical fast transient (EFT) disturbance is proposed for display panel protection. The circuit function to detect positive or negative electrical transients under EFT tests has been investigated in HSPICE simulation and verified in silicon chip. The output of the proposed transient detection circuit can be used as a firmware index to execute system automatic recovery operation. With hardware/firmware co-design, the immunity of display panel against transient disturbance under EFT tests can be significantly improved.
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