基于极值的临界单事件失效概率估计

2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2019-09-01 DOI:10.1109/radecs47380.2019.9745677

G. Zebrev, A. M. Galimov, R. G. Useinov, I. Fateev

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引用次数: 1

摘要

提出了一种新的集成电路在空间离子冲击下的生存概率函数。与传统方法不同，该函数基于与关键单事件效应相关的极值统计量。

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Extreme Value Based Estimation of Critical Single Event Failure Probability

A new survival probability function of ICs under space ion impact is proposed. Unlike the conventional approach, the function is based on the extreme value statistics which is relevant to the critical single event effects.

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来源期刊

2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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