金属-介电界面附近电荷探针及其响应分析

C. Ozzaim, C. Butler
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引用次数: 0

摘要

一种垂直于导电表面的电短细线天线常用于测量表面的法向电场或电荷密度。如果附近没有可以“加载”探针并改变其响应的物体,那么所谓的电荷探针的校准相对简单。在靠近介电或导电界面的表面上放置探针是一种实际的情况,如果期望进行精确的测量,就必须考虑探针的负载。本文的主要目的是为理解探针负载奠定基础,并提出一种简单的方法,用于计算电荷探针任意靠近界面时负载的影响。我们提出了一种简单而准确的方法来测定非常靠近接口的短导线中的电流。比较了采用索默菲尔德积分法和近似法计算的数据。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Analysis of a charge probe and its response near metallic and dielectric interface
An electrically short thin-wire antenna oriented normal to a conducting surface is often used to measure the normal electric field or charge density at the surface. Calibration of the so-called charge probe is relatively simple if there are no nearby objects which can "load" the probe and alter its response. A probe on a surface near a dielectric or conducting interface is a case of practical interest in which probe loading must be accounted for if accurate measurements are expected. The main purposes of this paper are to lay the groundwork for an understanding of probe loading and to suggest a simple method for accounting for the effects of loading as the charge probe becomes arbitrarily close to the interface. We present a simple and accurate method for determining the current in a short wire very near to an interface. Data computed from a method employing Sommerfeld integrals and the proposed approximate method are compared.
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