亚毫秒时间分辨率下绝缘子真空闪络事件二维表面电荷分布的测量

Y. Yamano, M. Miyazaki, S. Kobayashi, Y. Saito
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引用次数: 7

摘要

对真空中闪络事件的研究表明,绝缘子表面电荷对闪络有很大的影响。然而,大多数与表面充电相关的研究都是在高压激励后进行测量的。本研究利用波克尔斯效应在真空条件下对二维表面电荷分布进行了实时测量。利用这种测量方法,可以测量从高压施加到表面闪络事件期间介电样品上的电荷分布。本文研究了真空条件下非均匀交流电压作用下PET薄膜表面电荷分布的变化。此外,利用该方法还测量了PET薄膜表面放电前后的电荷分布。我们特别关注了表面放电前后三结附近的分布
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Measurement of 2-Dimensional Surface Charge Distributions under Vacuum Flashover Events on Insulators with Sub-milli-second temporal resolution
Most studies on a flashover event in vacuum has revealed that the surface charging on insulator has a great influence on the flashover. However, regarding most studies related to the surface charging, their measurements were carried out after high voltage excitation. In this research, the measurement of 2D surface charge distributions in real time has been carried out in vacuum by Pockels effect. With this measuring method, the charge distributions on a dielectric sample can be measured from the high voltage application to the surface flashover event. This paper describes the changes of the surface charge distributions on a PET film under non-uniform ac voltage application in vacuum. Moreover, using this method, the charge distribution just before and after a surface discharge event on the PET film has been measured. Especially we focus on the distribution near the triple junction just before and after the surface discharge event
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