{"title":"非常规仪表变压器(NCIT)与智能电子设备(IDE)之间的互操作性","authors":"D. Chatrefou, J. Dupraz, G. Montillet","doi":"10.1109/TDC.2006.1668694","DOIUrl":null,"url":null,"abstract":"Further to papers presented two years ago, at the IEEE T&D in Dallas, on non conventional instrument transformers (NCIT), advancement of the interoperability between sensors and processes are updated. Electronic technology has dramatically evolved in the last decade and the consequence is the generalization of digital designs for merging-units (MU) and intelligent electronic devices (IDE). Digital apparatus are an obvious improvement in output accuracy. These digital apparatus offer many potential advantages and are expected to grow in importance in the next decade","PeriodicalId":123024,"journal":{"name":"2005/2006 IEEE/PES Transmission and Distribution Conference and Exhibition","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Interoperability Between Non Conventional Instrument Transformers (NCIT) and Intelligent Electronic Devices (IDE)\",\"authors\":\"D. Chatrefou, J. Dupraz, G. Montillet\",\"doi\":\"10.1109/TDC.2006.1668694\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Further to papers presented two years ago, at the IEEE T&D in Dallas, on non conventional instrument transformers (NCIT), advancement of the interoperability between sensors and processes are updated. Electronic technology has dramatically evolved in the last decade and the consequence is the generalization of digital designs for merging-units (MU) and intelligent electronic devices (IDE). Digital apparatus are an obvious improvement in output accuracy. These digital apparatus offer many potential advantages and are expected to grow in importance in the next decade\",\"PeriodicalId\":123024,\"journal\":{\"name\":\"2005/2006 IEEE/PES Transmission and Distribution Conference and Exhibition\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2005/2006 IEEE/PES Transmission and Distribution Conference and Exhibition\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TDC.2006.1668694\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005/2006 IEEE/PES Transmission and Distribution Conference and Exhibition","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TDC.2006.1668694","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Interoperability Between Non Conventional Instrument Transformers (NCIT) and Intelligent Electronic Devices (IDE)
Further to papers presented two years ago, at the IEEE T&D in Dallas, on non conventional instrument transformers (NCIT), advancement of the interoperability between sensors and processes are updated. Electronic technology has dramatically evolved in the last decade and the consequence is the generalization of digital designs for merging-units (MU) and intelligent electronic devices (IDE). Digital apparatus are an obvious improvement in output accuracy. These digital apparatus offer many potential advantages and are expected to grow in importance in the next decade
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