CCD图像传感器中SEE击穿的研究

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2018-09-01 DOI:10.1109/RADECS45761.2018.9328684

M. Cherniak, R. Mozhaev, A. Pechenkin, D. Boychenko, A. Nikiforov

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引用次数: 0

摘要

本文的实验结果反映了在模拟激光设备上证实的重带电粒子作用下CCD传感器的电离击穿效应。对效果进行了初步分析，重点指出了关键部分。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Investigation of SEE Breakdown in CCD Image Sensor

The presented experimental results reflect the ionizing breakdown effect in CCD sensor under the fluence of heavy charged particles confirmed on a simulating laser facility. The effect primary analysis has been carried out, the critical parts have been highlighted.

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来源期刊

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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