浓度对化学浴沉积铜锡硫化薄膜形成的影响:SEM和EDX研究

H. Soonmin
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引用次数: 0

摘要

采用经济的化学浴沉积法在碱石灰玻璃衬底上沉积了纳米铜锡硫化膜。采用扫描电子显微镜(SEM)技术和能量色散x射线分析仪(EDX)方法对薄膜的形貌和组成进行了研究。EDX数据和SEM图像证实,元素(硫、锡和铜)的含量、形状和晶粒尺寸强烈依赖于薄膜形成过程中前驱体的浓度。实验结果表明,在实验过程中,使用较高浓度的溶液制备的薄膜可以观察到较高的元素原子百分比。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The Influence of Concentration on the Formation of Chemical Bath Deposited Copper Tin Sulphide Thin Films: SEM and EDX Studies
Nanostructured copper tin sulphide films have been deposited on the substrate (soda lime glass) via an economical chemical bath deposition method. The scanning electron microscopy (SEM) technique and energy dispersive X-ray analyzer (EDX) method were employed in this work to study the films’ morphology and composition. The EDX data and SEM images confirmed that the content of elements (sulfur, tin, and copper), the shape, and the grain size strongly depended on the concentration of the precursors during the formation of films. Experimental results revealed that a higher atomic percentage of the element could be observed for the films prepared using a higher concentration of solution during the experiment.
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