{"title":"低发射集成电路的设计","authors":"E. Sicard, S. Delmas Bendhia","doi":"10.1109/ICCDCS.2000.869805","DOIUrl":null,"url":null,"abstract":"This paper describes a set of efficient design techniques, which reduce significantly the parasitic emission of CMOS integrated circuits. Both layout level and package-related guidelines are presented. Most of these techniques are being applied successfully in state of the art 0.25 /spl mu/m CMOS designs.","PeriodicalId":301003,"journal":{"name":"Proceedings of the 2000 Third IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.00TH8474)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design of low emission integrated circuits\",\"authors\":\"E. Sicard, S. Delmas Bendhia\",\"doi\":\"10.1109/ICCDCS.2000.869805\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a set of efficient design techniques, which reduce significantly the parasitic emission of CMOS integrated circuits. Both layout level and package-related guidelines are presented. Most of these techniques are being applied successfully in state of the art 0.25 /spl mu/m CMOS designs.\",\"PeriodicalId\":301003,\"journal\":{\"name\":\"Proceedings of the 2000 Third IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.00TH8474)\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-03-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2000 Third IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.00TH8474)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCDCS.2000.869805\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2000 Third IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.00TH8474)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCDCS.2000.869805","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
本文介绍了一套有效的设计技术,可以显著降低CMOS集成电路的寄生发射。给出了布局级别和包相关的指导方针。这些技术中的大多数都成功地应用于最先进的0.25 /spl μ m CMOS设计中。
This paper describes a set of efficient design techniques, which reduce significantly the parasitic emission of CMOS integrated circuits. Both layout level and package-related guidelines are presented. Most of these techniques are being applied successfully in state of the art 0.25 /spl mu/m CMOS designs.