单壁碳纳米管束辐射损伤的积累与恢复

Proceedings of the 2014 37th International Spring Seminar on Electronics Technology Pub Date : 2014-05-07 DOI:10.1109/ISSE.2014.6887628

I. Uvarova, R. Rudenko, E. A. Voitsihovska, I. Yaskovets, B. Danilchenko

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引用次数: 1

摘要

在本研究中，我们研究了入射电子能量为1 MeV的电子辐照对单壁碳纳米管束电阻的影响。首次在液氦温度下进行辐照。为了确定辐射损伤积累及其进一步的热恢复，在宽温度范围内(5-300 K)原位测量了样品的电阻。结果表明，在~ 200 K的温度下，辐射损伤退火与管束中管间连接的形成有关。

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Accumulation and recovery of radiation-induced damages in single-walled carbon nanotube bundles

In presented study we investigate the influence of electron irradiation, with energy of incident electrons 1 MeV, on the electrical resistance of single-walled carbon nanotube bundles. Irradiation was performed at liquid helium temperature for the first time. To determine radiation-induced damages accumulation and its further thermal recovering, the samples resistance was in situ measured in wide temperature range (5-300 K). The results reveal radiation damage annealing at temperature ~ 200 K that we associate with formation of inter-tube links in the bundles.

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Proceedings of the 2014 37th International Spring Seminar on Electronics Technology

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