双基地扫频微波成像测量系统

D.-B. Lin, T. Chu
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引用次数: 1

摘要

对双基地后向散射条件下完美导电物体的扫频微波图像重建方案进行了实验研究。介绍了测量系统和校准过程。给出了两种散射对象的实验结果:长度为113 cm、半径为a = 0.5 cm的4个分布金属薄圆柱体的离散线散射体和1:100金属覆盖的B-52模型飞机的复杂散射体。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Bistatic frequency-swept microwave imaging measurement system
Experimental studies of the frequency-swept microwave image reconstruction scheme for perfectly conducting objects in a bistatic backward scattering arrangement are presented. The measurement system and calibration procedure are described. Experimental results are presented on two types of scattering objects: discrete line scatterers of four distributed metallic thin cylinders with length 113 cm and radius a = 0.5 cm, and a complex scattering object of a 1:100 metal-covered B-52 scale model aircraft.<>
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