硬盘制造过程中GMR磁头的软静电现象

2004 Electrical Overstress/Electrostatic Discharge Symposium Pub Date : 2004-09-01 DOI:10.1109/EOSESD.2004.5272644

Y. Mizoh, T. Nakano, K. Tagashira, K. Nakamura, T. Suzuki

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引用次数: 11

摘要

用于硬盘驱动器(HDD)的GMR磁头对ESD非常敏感。随着时间的推移，磁头的软磁性能下降是一种ESD损伤。我们报告了静电放电损伤的磁头退化模式以及其他损伤模式，如磁头划伤、电迁移效应和GMR堆腐蚀，这些通常难以通过QST和Spinstand测量测试明确区分。

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Soft ESD phenomena in GMR heads in the HDD manufacturing process

GMR heads used for hard disk drives (HDD) are very sensitive to ESD. A kind of ESD damage makes a soft magnetic degradation of head performance with time. We report examples of head degradation modes by ESD damage and other damage modes as head Scratch damage, electro migration effects and corrosion of GMR stack, which are usually difficult to be distinguished explicitly by QST and Spinstand measurement test.

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2004 Electrical Overstress/Electrostatic Discharge Symposium

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