{"title":"快速，通用，无损饼干检测系统使用光谱成像","authors":"J. Carstensen","doi":"10.23919/MVA.2017.7986910","DOIUrl":null,"url":null,"abstract":"A fast, versatile, and non-destructive method for assessing biscuit quality is presented. The method integrates color (or browning) measurement, moisture assessment, compositional and dimensional measurements on a spectral imaging platform using the silicon range 400–1000 nm.","PeriodicalId":193716,"journal":{"name":"2017 Fifteenth IAPR International Conference on Machine Vision Applications (MVA)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Fast, versatile, and non-destructive biscuit inspection system using spectral imaging\",\"authors\":\"J. Carstensen\",\"doi\":\"10.23919/MVA.2017.7986910\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A fast, versatile, and non-destructive method for assessing biscuit quality is presented. The method integrates color (or browning) measurement, moisture assessment, compositional and dimensional measurements on a spectral imaging platform using the silicon range 400–1000 nm.\",\"PeriodicalId\":193716,\"journal\":{\"name\":\"2017 Fifteenth IAPR International Conference on Machine Vision Applications (MVA)\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 Fifteenth IAPR International Conference on Machine Vision Applications (MVA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/MVA.2017.7986910\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 Fifteenth IAPR International Conference on Machine Vision Applications (MVA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/MVA.2017.7986910","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fast, versatile, and non-destructive biscuit inspection system using spectral imaging
A fast, versatile, and non-destructive method for assessing biscuit quality is presented. The method integrates color (or browning) measurement, moisture assessment, compositional and dimensional measurements on a spectral imaging platform using the silicon range 400–1000 nm.
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