高可靠性内置自检测和自校正设计，适用于DCT/IDCT应用

2011 IEEE International SOC Conference Pub Date : 2011-11-21 DOI:10.1109/SOCC.2011.6085106

Chang-Hsin Cheng, Chun-Lung Hsu, Chung-Kai Liu, Shih-Yin Lin

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引用次数: 0

摘要

本文提出了一种高效的内置自检测和自校正技术，用于基于双残码的离散余弦变换(DCT)/反离散余弦变换(IDCT)中的误差检测和校正。另一方面，DCT/IDCT的任何单比特误差都可以被有效地检测或校正。实验结果表明，所提出的BISDC架构具有良好的吞吐量性能，面积开销合理，可靠性高。

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High reliability built-in self-detection and self-correction design for DCT/IDCT application

This paper proposes an efficient built-in self-detection and self-correction techniques to detect and correct error in discrete cosine transform (DCT)/inverse discrete cosine transform (IDCT) based on the biresidue codes. On the other hand, any single bit error of DCT/IDCT can be efficiently detected or corrected. Experimental results show the proposed BISDC architecture has good performance in throughput with reasonable area overhead and high reliability.

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2011 IEEE International SOC Conference

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