基于灰度编码的低冗余双纠错点码4位多单元64位存储器

Shanshan Liu, P. Reviriego, K. Namba, S. Pontarelli, Liyi Xiao, F. Lombardi
{"title":"基于灰度编码的低冗余双纠错点码4位多单元64位存储器","authors":"Shanshan Liu, P. Reviriego, K. Namba, S. Pontarelli, Liyi Xiao, F. Lombardi","doi":"10.1109/DFT.2019.8875283","DOIUrl":null,"url":null,"abstract":"Non-volatile emerging Multilevel Cell (MLC) memories (such as magneto electric, magnetic resistive, memristor-based and phase change memories) are attractive to increase density. A key advantage of these memories is that they can store several bits per cell by using different levels. This however reduces the margins against noise and other effects and can lead to larger error rates. Errors in MLC memories are usually limited to magnitude-2 levels, and thus corrupt one or two bits per cell when using a Gray mapping from levels to bits. This enables the use of codes that can correct those error patterns in a memory cell instead of codes that correct all possible patterns in the cell, thus reducing complexity and cost. In this paper, the case of a 64 data bit memory built using memory cells that can store four bits and suffer up to double bit errors per cell is considered. Several (72, 64) Spotty codes that can correct double bit errors in 4-bit cells are designed and evaluated. The new codes require fewer parity bits than existing Spotty codes or symbol-based codes such as Hong-Patel codes. Therefore, they reduce the size of the memory while having encoding and decoding complexity similar to existing alternative codes.","PeriodicalId":415648,"journal":{"name":"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Low Redundancy Double Error Correction Spotty Codes Combined with Gray Coding for 64 Data Bits Memories of 4-bit Multilevel Cells\",\"authors\":\"Shanshan Liu, P. Reviriego, K. Namba, S. Pontarelli, Liyi Xiao, F. Lombardi\",\"doi\":\"10.1109/DFT.2019.8875283\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Non-volatile emerging Multilevel Cell (MLC) memories (such as magneto electric, magnetic resistive, memristor-based and phase change memories) are attractive to increase density. A key advantage of these memories is that they can store several bits per cell by using different levels. This however reduces the margins against noise and other effects and can lead to larger error rates. Errors in MLC memories are usually limited to magnitude-2 levels, and thus corrupt one or two bits per cell when using a Gray mapping from levels to bits. This enables the use of codes that can correct those error patterns in a memory cell instead of codes that correct all possible patterns in the cell, thus reducing complexity and cost. In this paper, the case of a 64 data bit memory built using memory cells that can store four bits and suffer up to double bit errors per cell is considered. Several (72, 64) Spotty codes that can correct double bit errors in 4-bit cells are designed and evaluated. The new codes require fewer parity bits than existing Spotty codes or symbol-based codes such as Hong-Patel codes. Therefore, they reduce the size of the memory while having encoding and decoding complexity similar to existing alternative codes.\",\"PeriodicalId\":415648,\"journal\":{\"name\":\"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFT.2019.8875283\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2019.8875283","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

非易失性新兴多电平单元(MLC)存储器(如磁电存储器、磁阻存储器、基于忆阻器的存储器和相变存储器)对提高密度具有吸引力。这些存储器的一个关键优点是,它们可以通过使用不同的级别来存储每个单元的几个比特。然而,这减少了对噪声和其他影响的余量,并可能导致更大的错误率。MLC存储器中的错误通常限制在2级,因此当使用从级到位的灰度映射时,每个单元会损坏一到两个比特。这使得可以使用可以纠正存储单元中错误模式的代码,而不是纠正存储单元中所有可能模式的代码,从而降低了复杂性和成本。在本文中,考虑了使用可以存储4位的存储单元构建的64位数据位存储器,并且每个单元最多遭受双位错误。几个(72,64)点码可以纠正双比特错误在4位单元设计和评估。与现有的Spotty码或基于符号的码(如Hong-Patel码)相比,新码需要更少的奇偶校验位。因此,它们减少了内存的大小,同时具有与现有替代代码相似的编码和解码复杂性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Low Redundancy Double Error Correction Spotty Codes Combined with Gray Coding for 64 Data Bits Memories of 4-bit Multilevel Cells
Non-volatile emerging Multilevel Cell (MLC) memories (such as magneto electric, magnetic resistive, memristor-based and phase change memories) are attractive to increase density. A key advantage of these memories is that they can store several bits per cell by using different levels. This however reduces the margins against noise and other effects and can lead to larger error rates. Errors in MLC memories are usually limited to magnitude-2 levels, and thus corrupt one or two bits per cell when using a Gray mapping from levels to bits. This enables the use of codes that can correct those error patterns in a memory cell instead of codes that correct all possible patterns in the cell, thus reducing complexity and cost. In this paper, the case of a 64 data bit memory built using memory cells that can store four bits and suffer up to double bit errors per cell is considered. Several (72, 64) Spotty codes that can correct double bit errors in 4-bit cells are designed and evaluated. The new codes require fewer parity bits than existing Spotty codes or symbol-based codes such as Hong-Patel codes. Therefore, they reduce the size of the memory while having encoding and decoding complexity similar to existing alternative codes.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信