{"title":"无声错误损坏:新的可靠性和测试挑战","authors":"A. Singh","doi":"10.1109/LATS58125.2023.10154487","DOIUrl":null,"url":null,"abstract":"Large commercial datacenters have recently highlighted a new and significant test and reliability challenge: manufacturing test escapes that cause silent data errors during operation. While there are many potential sources that can cause these failures, research is pointing to timing errors from random process variations, accentuated in power saving low voltage operation, being a significant contributor. Screening out such failures will require new and better timing tests that can reliably detect outlier circuits with path delay failures.","PeriodicalId":145157,"journal":{"name":"2023 IEEE 24th Latin American Test Symposium (LATS)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Silent Error Corruption: The New Reliability and Test Challenge\",\"authors\":\"A. Singh\",\"doi\":\"10.1109/LATS58125.2023.10154487\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Large commercial datacenters have recently highlighted a new and significant test and reliability challenge: manufacturing test escapes that cause silent data errors during operation. While there are many potential sources that can cause these failures, research is pointing to timing errors from random process variations, accentuated in power saving low voltage operation, being a significant contributor. Screening out such failures will require new and better timing tests that can reliably detect outlier circuits with path delay failures.\",\"PeriodicalId\":145157,\"journal\":{\"name\":\"2023 IEEE 24th Latin American Test Symposium (LATS)\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-03-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 IEEE 24th Latin American Test Symposium (LATS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/LATS58125.2023.10154487\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE 24th Latin American Test Symposium (LATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LATS58125.2023.10154487","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Silent Error Corruption: The New Reliability and Test Challenge
Large commercial datacenters have recently highlighted a new and significant test and reliability challenge: manufacturing test escapes that cause silent data errors during operation. While there are many potential sources that can cause these failures, research is pointing to timing errors from random process variations, accentuated in power saving low voltage operation, being a significant contributor. Screening out such failures will require new and better timing tests that can reliably detect outlier circuits with path delay failures.
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