{"title":"微波通信系统误码率随信噪比的自动测量","authors":"R. Kerczewski, Elaine S. Daugherty, I. Kramarchuk","doi":"10.1109/ARFTG.1987.323853","DOIUrl":null,"url":null,"abstract":"The performance of microwave systems and components for digital data transmission can be characterized by a plot of the bit-error rate as a function of the signal-to-noise ratio (or Eb/No). Methods for the efficient automated measurement of bit-error rates and signal-to-noise ratios, developed at NASA Lewis Research Center, are described. Noise measurement considerations and time requirements for measurement accuracy, as well as computer control and data processing methods, are discussed.","PeriodicalId":287736,"journal":{"name":"29th ARFTG Conference Digest","volume":"107 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Automated Measurement of the Bit-Error Rate as a Function of Signal-to-Noise Ratio for Microwave Communications Systems\",\"authors\":\"R. Kerczewski, Elaine S. Daugherty, I. Kramarchuk\",\"doi\":\"10.1109/ARFTG.1987.323853\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The performance of microwave systems and components for digital data transmission can be characterized by a plot of the bit-error rate as a function of the signal-to-noise ratio (or Eb/No). Methods for the efficient automated measurement of bit-error rates and signal-to-noise ratios, developed at NASA Lewis Research Center, are described. Noise measurement considerations and time requirements for measurement accuracy, as well as computer control and data processing methods, are discussed.\",\"PeriodicalId\":287736,\"journal\":{\"name\":\"29th ARFTG Conference Digest\",\"volume\":\"107 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"29th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.1987.323853\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"29th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1987.323853","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Automated Measurement of the Bit-Error Rate as a Function of Signal-to-Noise Ratio for Microwave Communications Systems
The performance of microwave systems and components for digital data transmission can be characterized by a plot of the bit-error rate as a function of the signal-to-noise ratio (or Eb/No). Methods for the efficient automated measurement of bit-error rates and signal-to-noise ratios, developed at NASA Lewis Research Center, are described. Noise measurement considerations and time requirements for measurement accuracy, as well as computer control and data processing methods, are discussed.
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