测量供电系统的阻抗,电流和开关活动的功能模具

I. Kantorovich, V. Drabkin, C. Houghton, J. St Laurent
{"title":"测量供电系统的阻抗,电流和开关活动的功能模具","authors":"I. Kantorovich, V. Drabkin, C. Houghton, J. St Laurent","doi":"10.1109/SPI.2005.1500888","DOIUrl":null,"url":null,"abstract":"Power delivery system (PDS) noise, current and impedance are major indicators of chip performance. The paper considers an approach in which on-chip impedance measurement is conducted for controlled periodic step-wise computer process. The main difficulty of the approach is current reconstruction. Current can be obtained from measured equivalent conductance of the chip, which can serve as a quantification of chip activity.","PeriodicalId":182291,"journal":{"name":"Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005.","volume":"71 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Measurement of power delivery system impedance, current and switching activity on functioning die\",\"authors\":\"I. Kantorovich, V. Drabkin, C. Houghton, J. St Laurent\",\"doi\":\"10.1109/SPI.2005.1500888\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Power delivery system (PDS) noise, current and impedance are major indicators of chip performance. The paper considers an approach in which on-chip impedance measurement is conducted for controlled periodic step-wise computer process. The main difficulty of the approach is current reconstruction. Current can be obtained from measured equivalent conductance of the chip, which can serve as a quantification of chip activity.\",\"PeriodicalId\":182291,\"journal\":{\"name\":\"Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005.\",\"volume\":\"71 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-05-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SPI.2005.1500888\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SPI.2005.1500888","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

功率传输系统(PDS)的噪声、电流和阻抗是芯片性能的主要指标。本文研究了一种对受控周期阶跃计算机过程进行片上阻抗测量的方法。该方法的主要难点是当前重建。电流可以从测量芯片的等效电导中获得,这可以作为芯片活性的量化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Measurement of power delivery system impedance, current and switching activity on functioning die
Power delivery system (PDS) noise, current and impedance are major indicators of chip performance. The paper considers an approach in which on-chip impedance measurement is conducted for controlled periodic step-wise computer process. The main difficulty of the approach is current reconstruction. Current can be obtained from measured equivalent conductance of the chip, which can serve as a quantification of chip activity.
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