I. Kantorovich, V. Drabkin, C. Houghton, J. St Laurent
{"title":"测量供电系统的阻抗,电流和开关活动的功能模具","authors":"I. Kantorovich, V. Drabkin, C. Houghton, J. St Laurent","doi":"10.1109/SPI.2005.1500888","DOIUrl":null,"url":null,"abstract":"Power delivery system (PDS) noise, current and impedance are major indicators of chip performance. The paper considers an approach in which on-chip impedance measurement is conducted for controlled periodic step-wise computer process. The main difficulty of the approach is current reconstruction. Current can be obtained from measured equivalent conductance of the chip, which can serve as a quantification of chip activity.","PeriodicalId":182291,"journal":{"name":"Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005.","volume":"71 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Measurement of power delivery system impedance, current and switching activity on functioning die\",\"authors\":\"I. Kantorovich, V. Drabkin, C. Houghton, J. St Laurent\",\"doi\":\"10.1109/SPI.2005.1500888\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Power delivery system (PDS) noise, current and impedance are major indicators of chip performance. The paper considers an approach in which on-chip impedance measurement is conducted for controlled periodic step-wise computer process. The main difficulty of the approach is current reconstruction. Current can be obtained from measured equivalent conductance of the chip, which can serve as a quantification of chip activity.\",\"PeriodicalId\":182291,\"journal\":{\"name\":\"Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005.\",\"volume\":\"71 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-05-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SPI.2005.1500888\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SPI.2005.1500888","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Measurement of power delivery system impedance, current and switching activity on functioning die
Power delivery system (PDS) noise, current and impedance are major indicators of chip performance. The paper considers an approach in which on-chip impedance measurement is conducted for controlled periodic step-wise computer process. The main difficulty of the approach is current reconstruction. Current can be obtained from measured equivalent conductance of the chip, which can serve as a quantification of chip activity.