用于CMOS成像仪列级单斜率ADC的1.8 V 3.2 /spl mu/W比较器

M. Snoeij, A. Theuwissen, J. Huijsing
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引用次数: 24

摘要

本文设计了一种1.8 V 3.2 /spl mu/W比较器。它采用混合偏置补偿方案,在输入偏置低于150 /spl mu/V的情况下实现超过60 dB的增益。该比较器采用0.18 /spl mu/m CMOS工艺设计,专门用于CMOS成像仪的列级单斜率ADC的关键组件。这种ADC架构因其低噪声而具有吸引力,但到目前为止,这是以相对较高的功耗为代价的。采用这种比较器设计,可以显著降低列级单斜率ADC的功耗。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A 1.8 V 3.2 /spl mu/W comparator for use in a CMOS imager column-level single-slope ADC
In this paper, a 1.8 V 3.2 /spl mu/W comparator is presented. It features a hybrid offset compensation scheme and achieves over 60 dB gain with an input offset below 150 /spl mu/V. The comparator is designed in a 0.18 /spl mu/m CMOS process and is specifically designed to be used as the key component of a column-level single-slope ADC of a CMOS imager. This ADC architecture is attractive because of its low noise, but so far this has come at the price of a relatively high power consumption. Using this comparator design, the power consumption of column-level single-slope ADC can be reduced significantly.
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