Modeling and language support for the management of pattern-bases

In our days knowledge extraction methods are able to produce artifacts (also called patterns) that concisely represent data. Patterns are usually quite heterogeneous and require ad-hoc processing techniques. So far, little emphasis has been posed on developing an overall integrated environment for uniformly representing and querying different types of patterns. Within the larger context of modelling, storing, and querying patterns, in this paper, we: (a) formally define the logical foundations for the global setting of pattern management through a model that covers data, patterns and their intermediate mappings; (b) present a pattern specification language for pattern management along with safety restrictions; and (c) introduce queries and query operators and identify interesting query classes.