预磁化引起铁氧体损耗增加的频率依赖性

A. Brockmeyer, J. Paulus-Neues
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引用次数: 23

摘要

电力电子中使用的磁性元件的铁氧体铁芯通常带有直流或低频预磁化偏置。工作表明,偏置场可能对再磁化损失有重大影响,因此必须在元件设计中加以考虑。本文利用精密的测量装置研究了预磁化引起的功率损耗增加与频率的关系。测量是在两个主要制造商的典型铁氧体上进行的。实验结果表明,软铁氧体的总再磁化损失有两个主要贡献,而预磁化只影响一个贡献。最后,本文讨论了偏置问题的数学描述的一些方面,从而提高了对磁性元件设计人员的理解。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Frequency dependence of the ferrite-loss increase caused by premagnetization
Ferrite cores of magnetic components used in power electronics are often biased with a DC or low frequency premagnetization. Work has shown that a bias field may have significant influence on the remagnetization losses and therefore has to be considered in the component design. Using a precise measurement setup this paper investigates the frequency dependence of the power loss increase due to premagnetization. The measurements are performed on typical ferrites of two major manufacturers. The experimental results show that there are two major contributions to the total remagnetization losses of soft-ferrites whereas only one contribution is influenced by premagnetization. Finally the paper discusses some aspects of a mathematical description for the bias problem and leads to an improved understanding that might be useful for the designer of magnetic components.
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