gesbte基光盘在680nm处的动态特性

F. Jiang, Chao-Te Liu, L. Men, Huiyong Liu
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引用次数: 1

摘要

研究了低写入功率(5 ~ 13 mw)的Ge-Sb-Te相变光盘在680 nm的动态特性。磁盘的载波/噪声约为45(约60 dB),擦除比约为23(约28 dB)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Dynamic properties of a GeSbTe-based optical disk at 680nm
The dynamic properties of a Ge-Sb-Te phase-change optical disk with low writing power (5 - 13 mw) at 680 nm were investigated. The Carrier/Noise of the disk is about 45 approximately 60 dB and the Erase ratio is 23 approximately 28 dB.
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