杂质掺杂对CrO/ sub2 /的影响

INTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005. Pub Date : 2005-04-04 DOI:10.1109/INTMAG.2005.1464160

K. Suzuki, Y. Satoh, M. Itoh, M. Matsubara, A. Sawada

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引用次数: 0

摘要

采用cr83 at铸锭在ZrO/ sub2 /衬底上沉积了CrO/ sub2 /薄膜。%和Ru 17 at。在纯净的氧气中氧化。x射线衍射、磁阻和温度对电阻测量的依赖性以及磁力显微镜(MFM)图像的观察表明，钌掺杂的CrO/ sub2 /薄膜的居里温度高于纯CrO/ sub2 /。

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Effects of impurity doping in CrO/sub 2/

The CrO/sub 2/ films were deposited on ZrO/sub 2/ substrates using the ingot of Cr 83 at.% and Ru 17 at.% and oxidized flowing the pure oxygen gas. The X-ray diffraction, the magnetoresistance and temperature dependence of the resistance measurements, and the observation of the image of magnetic force microscope (MFM) show the films include the Ru doped CrO/sub 2/ with Curie temperature lager than that of pure CrO/sub 2/.

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来源期刊

INTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005.

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0.50

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0.00%

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