{"title":"超大规模硅光子集成电路(VLSPIC)的光谱分辨干涉成像(会议报告)","authors":"S. Yoo","doi":"10.1117/12.2522152","DOIUrl":null,"url":null,"abstract":"This paper discusses design, fabrication, and experimental demonstration of very large-scale silicon photonic integrated circuits (VLSPIC) that include spectrometers, interferometers, and phase tuners to reconstruct spectrally resolved images. Recently-fabricated VLSPICs included 18 spectral bins and 12 baselines, successfully reconstructing reference images.","PeriodicalId":242044,"journal":{"name":"Image Sensing Technologies: Materials, Devices, Systems, and Applications VI","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Spectrally-resolved interferometric imaging by very large-scale silicon-photonic integrated circuits (VLSPIC) (Conference Presentation)\",\"authors\":\"S. Yoo\",\"doi\":\"10.1117/12.2522152\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discusses design, fabrication, and experimental demonstration of very large-scale silicon photonic integrated circuits (VLSPIC) that include spectrometers, interferometers, and phase tuners to reconstruct spectrally resolved images. Recently-fabricated VLSPICs included 18 spectral bins and 12 baselines, successfully reconstructing reference images.\",\"PeriodicalId\":242044,\"journal\":{\"name\":\"Image Sensing Technologies: Materials, Devices, Systems, and Applications VI\",\"volume\":\"62 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-05-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Image Sensing Technologies: Materials, Devices, Systems, and Applications VI\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.2522152\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Image Sensing Technologies: Materials, Devices, Systems, and Applications VI","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2522152","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Spectrally-resolved interferometric imaging by very large-scale silicon-photonic integrated circuits (VLSPIC) (Conference Presentation)
This paper discusses design, fabrication, and experimental demonstration of very large-scale silicon photonic integrated circuits (VLSPIC) that include spectrometers, interferometers, and phase tuners to reconstruct spectrally resolved images. Recently-fabricated VLSPICs included 18 spectral bins and 12 baselines, successfully reconstructing reference images.
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