一个教程和实验演示如何产生ESD及其对电子设备的影响

M. Issa
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引用次数: 0

摘要

仅给出摘要形式,如下。自20世纪60年代以来,人们已经认识到许多器件,如金属氧化物半导体、微处理器、双极器件、运算放大器,甚至分立元件都容易受到静电放电(ESD)的影响。因此,静电放电已成为电子工业的一大危害。本教程介绍了ESD的概念,并将其作为电磁兼容性(EMC)整体主题中的一个特殊主题。它介绍了ESD的基本方面,并回答了诸如:什么是ESD,如何产生ESD以及如何为ESD建模人体等问题。本文还给出了一个工程实例来计算静电放电对电子元件的破坏效应。实验演示是本教程不可分割的一部分。该实验说明了以下几点:a)当靠近带电介质材料时,导电表面如何被充电到非常高的电压;b)各种因素如何影响ESD的发生;C)电子元件的故障或电气过度应力可能导致的结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A tutorial and an experimental demonstration of how ESD is generated and its impact on electronic devices
Summary form only given, as follows. It has been recognized since the 1960s that many devices such as metal oxide semiconductors, microprocessors, bipolar devices, operational amplifiers, and even discrete components are susceptible to electrostatic discharge (ESD). Thus, ESD has become a hazard to the electronic industry. This tutorial paper presents the concept of ESD as a special topic in the overall subject of electromagnetic compatibility (EMC). It presents the fundamental aspects of ESD and answers questions such as: what is ESD, how is ESD generated, and how is the human body modeled for ESD? This tutorial paper also presents an engineering example to calculate the damaging effects of ESD on electronic components. The experimental demonstration is an integral part of this tutorial paper. The experiment illustrates the following: a) how an electrically conductive surface could be charged to very high voltages when in close proximity to a charged dielectric material; b) how various factors could impact the occurrence of ESD; c) how failure or electrical overstress on electronic components could result.
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