用功能公差限表征电气器件行为。

{"title":"用功能公差限表征电气器件行为。","authors":"Jason Adams, James Tucker, David Angeles, Tabytha Perez, T. Buchheit, Shahed Reza","doi":"10.2172/1888652","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":259665,"journal":{"name":"Proposed for presentation at the Mechanistic Machine Learning and Digital Twins for Computaional Science, Engineering, and Technology held September 26-29, 2021 in San Diego, CA US","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Characterizing Electrical Device Behavior with Functional Tolerance Bounds.\",\"authors\":\"Jason Adams, James Tucker, David Angeles, Tabytha Perez, T. Buchheit, Shahed Reza\",\"doi\":\"10.2172/1888652\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":259665,\"journal\":{\"name\":\"Proposed for presentation at the Mechanistic Machine Learning and Digital Twins for Computaional Science, Engineering, and Technology held September 26-29, 2021 in San Diego, CA US\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proposed for presentation at the Mechanistic Machine Learning and Digital Twins for Computaional Science, Engineering, and Technology held September 26-29, 2021 in San Diego, CA US\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.2172/1888652\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proposed for presentation at the Mechanistic Machine Learning and Digital Twins for Computaional Science, Engineering, and Technology held September 26-29, 2021 in San Diego, CA US","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2172/1888652","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}