{"title":"建立了办公室粉尘环境中卡边连接器失效与法向力和润滑关系的数学模型","authors":"M. Singer, V. Florescu","doi":"10.1109/HOLM.1989.77929","DOIUrl":null,"url":null,"abstract":"A study was undertaken to develop a mathematical model that correlates gold-plated card-edge connector reliability with contact design parameters in office-type corrosive gas and dust environments. The first phase of the study focused on connector behavior in an office dust environment. The authors describe the experiments, the statistical modeling approach, and the resultant mathematical model. This led to developing a novel expression for contact failure as a function of normal force and lubrication levels. Increasing contact normal force is found to decrease failure, whereas increasing lubrication levels (in the office dust environment) increase failure.<<ETX>>","PeriodicalId":441734,"journal":{"name":"Proceedings of the Thirty Fifth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A mathematical model relating card-edge connectors failure to normal force and lubrication in office dust environment\",\"authors\":\"M. Singer, V. Florescu\",\"doi\":\"10.1109/HOLM.1989.77929\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A study was undertaken to develop a mathematical model that correlates gold-plated card-edge connector reliability with contact design parameters in office-type corrosive gas and dust environments. The first phase of the study focused on connector behavior in an office dust environment. The authors describe the experiments, the statistical modeling approach, and the resultant mathematical model. This led to developing a novel expression for contact failure as a function of normal force and lubrication levels. Increasing contact normal force is found to decrease failure, whereas increasing lubrication levels (in the office dust environment) increase failure.<<ETX>>\",\"PeriodicalId\":441734,\"journal\":{\"name\":\"Proceedings of the Thirty Fifth Meeting of the IEEE Holm Conference on Electrical Contacts\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-09-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the Thirty Fifth Meeting of the IEEE Holm Conference on Electrical Contacts\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HOLM.1989.77929\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Thirty Fifth Meeting of the IEEE Holm Conference on Electrical Contacts","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.1989.77929","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A mathematical model relating card-edge connectors failure to normal force and lubrication in office dust environment
A study was undertaken to develop a mathematical model that correlates gold-plated card-edge connector reliability with contact design parameters in office-type corrosive gas and dust environments. The first phase of the study focused on connector behavior in an office dust environment. The authors describe the experiments, the statistical modeling approach, and the resultant mathematical model. This led to developing a novel expression for contact failure as a function of normal force and lubrication levels. Increasing contact normal force is found to decrease failure, whereas increasing lubrication levels (in the office dust environment) increase failure.<>