{"title":"高速数字通信器件测试方法的发展","authors":"G. LeCheminant","doi":"10.1109/GAAS.2002.1049060","DOIUrl":null,"url":null,"abstract":"Varied system architectures, strong competition, and a weak marketplace have made the process of Gbit/s component evaluation and verification far more complicated than simply making accurate measurements. While compliance to industry standards is essential, cost is becoming increasingly important, with test being a significant portion of overall cost. This paper compares and contrasts Ethernet and SONET/SDH test strategies for 10 Gbit/s transmission, and takes a forward look to 40 Gbit/s devices.","PeriodicalId":142875,"journal":{"name":"24th Annual Technical Digest Gallium Arsenide Integrated Circuit (GaAs IC) Symposiu","volume":"379 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The evolution of test methodologies for high-speed digital communications components\",\"authors\":\"G. LeCheminant\",\"doi\":\"10.1109/GAAS.2002.1049060\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Varied system architectures, strong competition, and a weak marketplace have made the process of Gbit/s component evaluation and verification far more complicated than simply making accurate measurements. While compliance to industry standards is essential, cost is becoming increasingly important, with test being a significant portion of overall cost. This paper compares and contrasts Ethernet and SONET/SDH test strategies for 10 Gbit/s transmission, and takes a forward look to 40 Gbit/s devices.\",\"PeriodicalId\":142875,\"journal\":{\"name\":\"24th Annual Technical Digest Gallium Arsenide Integrated Circuit (GaAs IC) Symposiu\",\"volume\":\"379 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-12-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"24th Annual Technical Digest Gallium Arsenide Integrated Circuit (GaAs IC) Symposiu\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/GAAS.2002.1049060\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"24th Annual Technical Digest Gallium Arsenide Integrated Circuit (GaAs IC) Symposiu","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GAAS.2002.1049060","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The evolution of test methodologies for high-speed digital communications components
Varied system architectures, strong competition, and a weak marketplace have made the process of Gbit/s component evaluation and verification far more complicated than simply making accurate measurements. While compliance to industry standards is essential, cost is becoming increasingly important, with test being a significant portion of overall cost. This paper compares and contrasts Ethernet and SONET/SDH test strategies for 10 Gbit/s transmission, and takes a forward look to 40 Gbit/s devices.
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