基于NDE的迁移学习缺陷跟踪

Subrata Mukherjee, Xuhui Huang, V. Rathod, L. Udpa, Y. Deng
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引用次数: 8

摘要

使用中的管道基础设施系统会随着时间的推移而不断退化。由于缺陷随着时间的推移而增长,为了安全起见,必须定期对其进行检查,以发现有害缺陷。本文提出了一种利用漏磁传感器数据动态更新迁移学习技术识别缺陷生长的新方法。在管道内使用管道检测计(PIG)收集准确、低噪声的缺陷检测读数是昂贵且耗时的。在操作管道中运行探针会产生噪声数据。在本文中,我们考虑在开始时在管道内进行较少噪声和耗时的基线读数。使用基线数据,我们的目标是首先在检查期间自动检测有缺陷的区域,然后监视这些缺陷的增长。基于基线数据,采用基于混合回归框架的函数估计方法估计二元函数,计算各扫描点缺陷的后验概率;由此可见,在后续检测中应用带噪声现场数据的直接函数估计是无效的。我们通过利用先前检查中的缺陷概率和位置来使用迁移学习透视图,然后通过应用动态更新的迁移学习技术基于当前数据更新这些概率。该方法对缺陷生长进行了动态跟踪和表征,具有较高的精度和灵敏度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Defects Tracking via NDE Based Transfer Learning
Pipe infrastructure systems in service continue to degrade with passage of time. As the defects grow with time, for safety purposes, they have to be inspected periodically for detection of harmful defects. This paper presents development of a novel method for identifying defect growth using dynamically updated transfer learning technique on data from magnetic flux leakage (MFL) sensors. The operation of pipeline inspection gauge (PIG) within the pipeline to collect accurate, low noise readings for defect detection is expensive and time-consuming. Running probes within the operational pipeline produces noisy data. In this paper we consider a less noisy and time-consuming baseline readings within pipelines taken in the beginning. Using the baseline data, our goal is to first automatically detect the defective areas during inspection and thereafter monitor the growth of those defects. Based on the baseline data, a bivariate function was estimated using a function estimation method based on mixture regression framework to compute posterior probabilities of the defects at each scanning point. Thereafter, it is seen that applying direct function estimation with noisy field data on subsequent inspections is not effective. We use transfer learning perspectives by leveraging the defect probabilities and location from the previous inspections, and then consequently update those probabilities based on current data by applying a dynamically updated transfer learning technique. The defect growth is dynamically tracked and characterized with high accuracy and sensitivity.
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