一种新型光伏性能表征方法的应用与验证

Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997 Pub Date : 1997-12-31 DOI:10.1109/PVSC.1997.654315

C. Whitaker, T. Townsend, J. Newmiller, D. King, W. Boyson, J. Kratochvil, D. Collier, D. Osborn

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引用次数: 87

摘要

由于难以获得“额定”条件下的性能数据，PV输出与现行条件之间的复杂关系，以及以低成本快速获得结果的愿望，对光伏系统进行评级是复杂的。自1989年以来，PVUSA一直在使用连续的数据收集和简单的回归模型对光伏系统进行评级。桑迪亚国家实验室开发了一种改进的基于IV曲线的方法来表征光伏阵列。位于加利福尼亚州戴维斯的PVUSA工厂的几个系统都采用了这两种方法。本文介绍了这项工作的结果。

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Application and validation of a new PV performance characterization method

Rating a PV system is complicated by the difficulties of obtaining performance data under the "rating" conditions, the intricate relationships between PV output and prevailing conditions, and the desire for quick results at low cost. Since 1989, PVUSA has been rating PV systems using continuous data collection and a simple regression model. Sandia National Laboratories has developed an improved IV curve-based method for characterizing PV arrays. Several systems at the PVUSA facility in Davis, CA were subjected to both methods. The results of that work are presented in this paper.

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Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997

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