J. Killian, D. Niemann, N. Zuckerman, J. Silan, B. Ribaya, M. Rahman, M. Meyyappan, C. Nguyen
{"title":"金属合金表面碳纳米管柱阵列的场发射特性","authors":"J. Killian, D. Niemann, N. Zuckerman, J. Silan, B. Ribaya, M. Rahman, M. Meyyappan, C. Nguyen","doi":"10.1109/IVELEC.2008.4556390","DOIUrl":null,"url":null,"abstract":"Carbon nanotube pillar arrays (CPAs) for cold field emission were fabricated using a conventional photolithography process, and the geometry of these arrays was studied and the effect of pillar height on field emission was quantified. Our CPA samples achieved turn-on fields as low as 0.9 V/mum and stable current densities of 10 mA/cm2 at applied field lower than 6V/mum.","PeriodicalId":113971,"journal":{"name":"2008 IEEE International Vacuum Electronics Conference","volume":"68 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Field emission properties of carbon nanotube pillar arrays patterned directly on metal alloy surfaces\",\"authors\":\"J. Killian, D. Niemann, N. Zuckerman, J. Silan, B. Ribaya, M. Rahman, M. Meyyappan, C. Nguyen\",\"doi\":\"10.1109/IVELEC.2008.4556390\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Carbon nanotube pillar arrays (CPAs) for cold field emission were fabricated using a conventional photolithography process, and the geometry of these arrays was studied and the effect of pillar height on field emission was quantified. Our CPA samples achieved turn-on fields as low as 0.9 V/mum and stable current densities of 10 mA/cm2 at applied field lower than 6V/mum.\",\"PeriodicalId\":113971,\"journal\":{\"name\":\"2008 IEEE International Vacuum Electronics Conference\",\"volume\":\"68 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-04-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 IEEE International Vacuum Electronics Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVELEC.2008.4556390\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE International Vacuum Electronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVELEC.2008.4556390","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Field emission properties of carbon nanotube pillar arrays patterned directly on metal alloy surfaces
Carbon nanotube pillar arrays (CPAs) for cold field emission were fabricated using a conventional photolithography process, and the geometry of these arrays was studied and the effect of pillar height on field emission was quantified. Our CPA samples achieved turn-on fields as low as 0.9 V/mum and stable current densities of 10 mA/cm2 at applied field lower than 6V/mum.