{"title":"一种校正各向同性电磁场探针的方法","authors":"K. Matloubi","doi":"10.1109/ISEMC.1991.148236","DOIUrl":null,"url":null,"abstract":"In order for isotropic E-field (electric field) probes to measure the strength of electric fields accurately, they must be calibrated very accurately. A highly accurate method of calibrating such probes is discussed. The method describes equipment and facilities used to generate standard electric fields up to frequencies in the microwave range. The field strengths are accurately calculated using standard equations. Suggested orientation and positioning of the probe and its elements within the electric field is described.<<ETX>>","PeriodicalId":243730,"journal":{"name":"IEEE 1991 International Symposium on Electromagnetic Compatibility","volume":"66 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A method for calibration of isotropic, E-field probes\",\"authors\":\"K. Matloubi\",\"doi\":\"10.1109/ISEMC.1991.148236\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In order for isotropic E-field (electric field) probes to measure the strength of electric fields accurately, they must be calibrated very accurately. A highly accurate method of calibrating such probes is discussed. The method describes equipment and facilities used to generate standard electric fields up to frequencies in the microwave range. The field strengths are accurately calculated using standard equations. Suggested orientation and positioning of the probe and its elements within the electric field is described.<<ETX>>\",\"PeriodicalId\":243730,\"journal\":{\"name\":\"IEEE 1991 International Symposium on Electromagnetic Compatibility\",\"volume\":\"66 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-08-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 1991 International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1991.148236\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 1991 International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1991.148236","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A method for calibration of isotropic, E-field probes
In order for isotropic E-field (electric field) probes to measure the strength of electric fields accurately, they must be calibrated very accurately. A highly accurate method of calibrating such probes is discussed. The method describes equipment and facilities used to generate standard electric fields up to frequencies in the microwave range. The field strengths are accurately calculated using standard equations. Suggested orientation and positioning of the probe and its elements within the electric field is described.<>
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