1.54 /spl mu/m氘化甲烷激光光谱作为光通信参考标准

Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI:10.1109/IMTC.2004.1351564

C. Svelto, E. Bava, G. Galzerano

{"title":"1.54 /spl mu/m氘化甲烷激光光谱作为光通信参考标准","authors":"C. Svelto, E. Bava, G. Galzerano","doi":"10.1109/IMTC.2004.1351564","DOIUrl":null,"url":null,"abstract":"In this paper we present the first laser-spectroscopy measurements on CH/sub 3/D molecules at 1.54 /spl mu/m wavelength. In particular, the Voigt absorption profiles for the R(6) transition at 1543.78 nm were measured by FM spectroscopy and numerical integration of the 1-st derivative signals. From measurements of the collisional broadening contribution at 3 different gas pressures, the collisional broadening coefficient for the 1.54 /spl mu/m transition was obtained.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Laser spectroscopy of deuterated methane at 1.54 /spl mu/m as a reference standard for optical communications\",\"authors\":\"C. Svelto, E. Bava, G. Galzerano\",\"doi\":\"10.1109/IMTC.2004.1351564\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we present the first laser-spectroscopy measurements on CH/sub 3/D molecules at 1.54 /spl mu/m wavelength. In particular, the Voigt absorption profiles for the R(6) transition at 1543.78 nm were measured by FM spectroscopy and numerical integration of the 1-st derivative signals. From measurements of the collisional broadening contribution at 3 different gas pressures, the collisional broadening coefficient for the 1.54 /spl mu/m transition was obtained.\",\"PeriodicalId\":386903,\"journal\":{\"name\":\"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-05-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.2004.1351564\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.2004.1351564","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

本文首次对波长为1.54 /spl μ m的CH/sub - 3/D分子进行了激光光谱测量。特别地，利用调频光谱和1阶导数信号的数值积分测量了1543.78 nm处R(6)跃迁的Voigt吸收谱。通过对3种不同气体压力下的碰撞展宽贡献的测量，得到了1.54 /spl mu/m跃迁的碰撞展宽系数。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Laser spectroscopy of deuterated methane at 1.54 /spl mu/m as a reference standard for optical communications

In this paper we present the first laser-spectroscopy measurements on CH/sub 3/D molecules at 1.54 /spl mu/m wavelength. In particular, the Voigt absorption profiles for the R(6) transition at 1543.78 nm were measured by FM spectroscopy and numerical integration of the 1-st derivative signals. From measurements of the collisional broadening contribution at 3 different gas pressures, the collisional broadening coefficient for the 1.54 /spl mu/m transition was obtained.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)

自引率

0.00%

发文量