{"title":"错误检测/定位的编码DNA自组装","authors":"Z. M. Arani, M. Hashempour, F. Lombardi","doi":"10.1109/DFT.2009.13","DOIUrl":null,"url":null,"abstract":"This paper proposes a novel framework in which DNA self-assembly can be analyzed for error detection/ location. The proposed framework relies on coding and mapping functions that allow to establish the presence of erroneous bonded tiles based on the pattern to be assembled (as defined by the tile set) and its current aggregate. As a widely used pattern and instantiation of this process, the Sierpinski Triangle self-assembly is analyzed in detail.","PeriodicalId":405651,"journal":{"name":"2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Coded DNA Self-Assembly for Error Detection/Location\",\"authors\":\"Z. M. Arani, M. Hashempour, F. Lombardi\",\"doi\":\"10.1109/DFT.2009.13\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes a novel framework in which DNA self-assembly can be analyzed for error detection/ location. The proposed framework relies on coding and mapping functions that allow to establish the presence of erroneous bonded tiles based on the pattern to be assembled (as defined by the tile set) and its current aggregate. As a widely used pattern and instantiation of this process, the Sierpinski Triangle self-assembly is analyzed in detail.\",\"PeriodicalId\":405651,\"journal\":{\"name\":\"2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-10-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFT.2009.13\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2009.13","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Coded DNA Self-Assembly for Error Detection/Location
This paper proposes a novel framework in which DNA self-assembly can be analyzed for error detection/ location. The proposed framework relies on coding and mapping functions that allow to establish the presence of erroneous bonded tiles based on the pattern to be assembled (as defined by the tile set) and its current aggregate. As a widely used pattern and instantiation of this process, the Sierpinski Triangle self-assembly is analyzed in detail.