采用130纳米3D集成电路技术,具有100个tdc的双背面照明800单元多通道数字SiPM

E. Charbon, Mario Scandini, J. M. Pavia, Martin Wolf
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引用次数: 22

摘要

我们报告了世界上第一个在3D集成电路技术中实现的背照硅光电倍增管(SiPM)。SiPM采用两层130nm CMOS工艺制备;顶层容纳1600个单光子雪崩二极管(spad),以双4×200线性阵列组织;底层容纳2×100时间-数字转换器(tdc)。每8个spad有一个共享TDC,其数字输出路由到1.04Gps读出接口,使总计数率为80Mcps。初步结果表明,在室温和标称偏置条件下,725nm波长下的光子探测概率为11%,暗计数率为1kHz,在-40°C和2V偏置条件下,暗计数率降至80Hz;测得击穿电压Vbd为12.3V。该传感器用于飞行时间视觉、宽视场近红外成像和寿命荧光光谱,用于医疗、颗粒检测和材料分析应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A dual backside-illuminated 800-cell multi-channel digital SiPM with 100 TDCs in 130nm 3D IC technology
We report on the world's first backside-illuminated silicon photomultiplier (SiPM) implemented in 3D integrated circuit technology. The SiPM was fabricated in a two-tier 130nm CMOS process; the top tier houses 1600 single-photon avalanche diodes (SPADs), organized in a dual 4×200 linear array; the bottom tier houses 2×100 time-to-digital converters (TDCs). Every 8 SPADs there is one shared TDC whose digital output is routed to a 1.04Gps readout interface that enables a total count rate of 80Mcps. Preliminary results show a photon detection probability of 11% at a wavelength of 725nm and a dark count rate of 1kHz at room temperature and nominal excess bias, which reduces to 80Hz if cooled to -40°C at 2V excess bias; the breakdown voltage, Vbd, was measured at 12.3V. The sensor is intended for time-of-flight vision, wide-field near-infrared imaging, and lifetime fluorescence spectroscopy used in medical, particle detection, and material analysis applications.
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