瑞利-里兹法是测量相对介电常数ε′和介电损耗tgδε的一种仪器,用于开发各种类型微波介质的技术

R. Frender, K. Zaręba, T. Mroz, P. Dyderski
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引用次数: 0

摘要

本文讨论了用谐振瑞利-里兹法测量ε′和tgδε在各类微波介质技术开发中的应用。测量ε′的不确定度小于0.2%,可以精确地设计电介质的化学成分,并确定它们的功能特性,这对它们的应用非常重要。文中举例说明了该方法对三种选定的介电介质的能力:ε′= 8的复合材料;ε' = 10和ε' = 37的陶瓷。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The rayleigh-ritz method of measuring relative dielectric permittivity ε' and dielectric loss tgδε as an instrument used for the development of technology of various types of microwave dielectrics
The paper deals with employing the resonant Rayleigh-Ritz method of measuring ε' and tgδε for the development of technology of various types of microwave dielectrics. The possibility of measuring ε' with uncertainties smaller than 0.2% allows to precisely design chemical composition of dielectrics as well as determine their functional properties which are important in terms of their application. The paper illustrates the capabilities of the method for three chosen types of dielectrics -composite with ε' ≅ 8; ceramic with ε' ≅ 10 as well as the one with ε' ≅ 37.
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