P. Macdonald, D. Rensch, J.Y. Josefowicz, F. Williams, W. Hoefer
{"title":"LaAlO/ sub3 /上微带不连续的表征","authors":"P. Macdonald, D. Rensch, J.Y. Josefowicz, F. Williams, W. Hoefer","doi":"10.1109/MWSYM.1991.147274","DOIUrl":null,"url":null,"abstract":"The difference between microstrip-coupled line filter designs using quasi-static and full-wave analyses on LaAlO/sub 3/ is discussed. Comparative data for CAD (computer-aided design) predictions and direct measurement for selected microstrip discontinuities on LaAlO/sub 3/ substrates are presented, as well as measured and predicted filter performance.<<ETX>>","PeriodicalId":263441,"journal":{"name":"1991 IEEE MTT-S International Microwave Symposium Digest","volume":"59 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Characterization of microstrip discontinuities on LaAlO/sub 3/\",\"authors\":\"P. Macdonald, D. Rensch, J.Y. Josefowicz, F. Williams, W. Hoefer\",\"doi\":\"10.1109/MWSYM.1991.147274\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The difference between microstrip-coupled line filter designs using quasi-static and full-wave analyses on LaAlO/sub 3/ is discussed. Comparative data for CAD (computer-aided design) predictions and direct measurement for selected microstrip discontinuities on LaAlO/sub 3/ substrates are presented, as well as measured and predicted filter performance.<<ETX>>\",\"PeriodicalId\":263441,\"journal\":{\"name\":\"1991 IEEE MTT-S International Microwave Symposium Digest\",\"volume\":\"59 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-07-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1991 IEEE MTT-S International Microwave Symposium Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSYM.1991.147274\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991 IEEE MTT-S International Microwave Symposium Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1991.147274","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Characterization of microstrip discontinuities on LaAlO/sub 3/
The difference between microstrip-coupled line filter designs using quasi-static and full-wave analyses on LaAlO/sub 3/ is discussed. Comparative data for CAD (computer-aided design) predictions and direct measurement for selected microstrip discontinuities on LaAlO/sub 3/ substrates are presented, as well as measured and predicted filter performance.<>