{"title":"多层印刷电路中嵌入式离散电容器和薄膜电容器的分析模型","authors":"I. Erdin","doi":"10.1109/EDAPS56906.2022.9995666","DOIUrl":null,"url":null,"abstract":"Analytical models are proposed for accurate characterization of embedded capacitors in multilayered printed circuit stackups. In the proposed algorithm, a printed circuit board (PCB) is represented as a stack of resonant cavities with embedded thin film and discrete capacitors modeled as layers and components, respectively, in an inner cavity. This representation allows for a mathematical model in the form of finite continued fractions. The frequency domain response of the proposed model is observed in good agreement with data from numerical electromagnetic (EM) simulations, which validate its accuracy. The developed model is intended for quick and practical power integrity (PI) analysis of printed circuits with idefinite number of stackup layers.","PeriodicalId":401014,"journal":{"name":"2022 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Analytical Models for Embedded Discrete and Thin Film Capacitors in Multilayered Printed Circuits\",\"authors\":\"I. Erdin\",\"doi\":\"10.1109/EDAPS56906.2022.9995666\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Analytical models are proposed for accurate characterization of embedded capacitors in multilayered printed circuit stackups. In the proposed algorithm, a printed circuit board (PCB) is represented as a stack of resonant cavities with embedded thin film and discrete capacitors modeled as layers and components, respectively, in an inner cavity. This representation allows for a mathematical model in the form of finite continued fractions. The frequency domain response of the proposed model is observed in good agreement with data from numerical electromagnetic (EM) simulations, which validate its accuracy. The developed model is intended for quick and practical power integrity (PI) analysis of printed circuits with idefinite number of stackup layers.\",\"PeriodicalId\":401014,\"journal\":{\"name\":\"2022 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-12-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDAPS56906.2022.9995666\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDAPS56906.2022.9995666","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Analytical Models for Embedded Discrete and Thin Film Capacitors in Multilayered Printed Circuits
Analytical models are proposed for accurate characterization of embedded capacitors in multilayered printed circuit stackups. In the proposed algorithm, a printed circuit board (PCB) is represented as a stack of resonant cavities with embedded thin film and discrete capacitors modeled as layers and components, respectively, in an inner cavity. This representation allows for a mathematical model in the form of finite continued fractions. The frequency domain response of the proposed model is observed in good agreement with data from numerical electromagnetic (EM) simulations, which validate its accuracy. The developed model is intended for quick and practical power integrity (PI) analysis of printed circuits with idefinite number of stackup layers.