带偏振分析的低温扫描场发射显微镜

2020 33rd International Vacuum Nanoelectronics Conference (IVNC) Pub Date : 2020-07-01 DOI:10.1109/IVNC49440.2020.9203490

A. Thamm, M. Demydenko, T. Michlmayr, D. Pescia, U. Ramsperger

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引用次数: 0

摘要

提出了一种适用于自旋极化分析的场发射低温扫描探针显微镜的设计方案。在77 K的温度下实现了性能。证明了原子分辨率的STM成像的第一个结果。

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Low-temperature scanning field emission microscope with polarization analysis

the design of the low-temperature scanning probe microscope, which works in field emission regime with spin polarization analysis, is proposed. A performance at temperature of 77 K has been achieved. The first result of STM imaging with atomic resolution is demonstrated.

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2020 33rd International Vacuum Nanoelectronics Conference (IVNC)

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