离子注入氮化镓

J.S. Williams, H. Tan, J. Zolper
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引用次数: 20

摘要

氮化镓的植入对于选择性掺杂和隔离应用非常重要。本文报道了硅注入GaN在高达1100℃的退火过程中去除离子注入损伤的极端困难。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Ion implantation into gallium nitride
Implantation of GaN is important for selective doping and isolation applications. This paper reports on the extreme difficulty in removing ion implantation damage from Si-implanted GaN during annealing up to 1100/spl deg/C.
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