软件产品线的自动化和可伸缩的T-wise测试用例生成策略

Gilles Perrouin, S. Sen, Jacques Klein, B. Baudry, Yves Le Traon
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引用次数: 241

摘要

软件产品线(SPL)由于其特性的可变性引起的组合而难以验证。这导致了可导乘积数量的组合爆炸。在如此大的产品空间中进行详尽的测试是不可行的。一种可能的选择是通过生成覆盖所有可能的T功能交互(T-wise)的测试用例来测试spc。T-wise大大减少了测试产品的数量,同时确保合理的SPL覆盖。然而,使用SAT求解器自动生成满足T-wise的测试用例会引起两个问题。将SPL模型和t-准则编码为求解器可接受的一组公式,并满足“一次性”处理时无法满足的要求。我们提出了一个可扩展的工具集,使用Alloy从SPL模型自动生成满足T-wise的测试用例。我们定义了将t型组合分割成可解子集的策略。我们设计和计算指标来评估Aspect OPTIMA上的策略,这是一个具体的事务SPL。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines
Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the number of derivable products. Exhaustive testing in such a large space of products is infeasible. One possible option is to test SPLs by generating test cases that cover all possible T feature interactions (T-wise). T-wise dramatically reduces the number of test products while ensuring reasonable SPL coverage. However, automatic generation of test cases satisfying T-wise using SAT solvers raises two issues. The encoding of SPL models and T-wise criteria into a set of formulas acceptable by the solver and their satisfaction which fails when processed ``all-at-once''. We propose a scalable toolset using Alloy to automatically generate test cases satisfying T-wise from SPL models. We define strategies to split T-wise combinations into solvable subsets. We design and compute metrics to evaluate strategies on Aspect OPTIMA, a concrete transactional SPL.
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